Pick & Place-Process with Highest Precision.
Five clever measurement methods can do the job.
THE LOCALISING IMAGE PROCESSING PLAYS A MAJOR PART.
To run a pick-and-place process with highest precision it is necessary to optically measure the position of all components before production start. To do this successfully AMADYNE offers several methods from its own image processing library.
FIVE CLEVER METHODS.
There is a distinction between those methods which supply position and angle information and those which only supply position information. AMADYNE has five methods in its portfolio: Pattern Recognition, Fiducial Recognition, SMD-Recognition, Circle Recognition, and Surface Focus.
This clever feature represents an automatic stabilizer and enables great system robustness.
PATTERN RECOGNITION AND EDGE PROFILES.
The AMADYNE feature-based pattern recognition analyzes reference images and very precisely compares coherent edge profiles (brightness criteria) there. These are subsequently recorded and only their position and direction is stored. The search-image is treated accordingly, and the system looks for the position of the best accordance with the edge profiles.
EXTRACTION OF CONTRAST TRANSITION.
The system’s robustness is increased by this step of extraction of coherent contrast transition. Robustness in terms of changing illumination processes, disturbance and noise. By the pattern recognition users can get subpixel-precise position and angle information.
Precision is Our Credo.
Discard probability reduced to nearly zero.
EXTREME SMALL PASSER BRANDS AND SYNTHETICAL REFERENCE IMAGES.
Reference passer brands which calculate the very important positions in a micrometer range and are designed for automatic corrections are called passer fiducials. The AMADYNE feature-based technique uses an ideal synthetic reference image which has been selected from a strongly equipped sample library and which can be also automatically be adjusted. This synthetic reference image is the foundation for a subsequent process: the normal pattern recognition.
FLUCTUATION OF SRUCTURE RECOGNITION CAN BE AVOIDED.
More accuracy and a better reliability can be reached by this method if there are normal fluctuations in terms of structure, form and size recognition. There’s subpixel-precise information, too.
Standard Component Measurement of JEDEC-Housed Items.
AMADYNE’s own and special solution.
PASSIVE SMD (SURFACE MOUNTED DEVICE) MEASUREMENT.
A precise optical measurement of passive JRDEC-housed SMD-components often represents a major challenge. Therefore, AMADYNE offers a special solution which is optimized with respect to geometric and optical specifications of such units. There is recognition of contact surfaces and subsequently of bodies and rotations.
SUBPIXEL-PRECISE INFORMATION AVAILABLE.
This kind of measurement supplies subpixel-precise position and angle information.
Reliable Recognition …
… of circles larger than the camera-produced image.
THIS KIND OF RECOGNITION SUPPLIES SUBPIXEL-PRECISE RESULTS.
Based on the Hough-Transformation this method has been designed for the recognition of circles. Even circular forms which are larger than the camera-created image can be recognized by this technology. It is enough to visualize a rudimental image section. The centre is always outside of the FOV. The circle recognition supplies a subpixel-precise position but logically no angle information.